Probe needles are used throughout the semiconductor industry for inspection and measurement as a probe station accessory. These can be customized and manufactured to suit the exact application.

φ0.7 ・ θ15°・ 15μR

φ0.7 ・ θ10°・ 150μR

φ0.7 ・ θ15°・ 250μR

 

We allow you to specify customized materials, diameters (φD), angles (θ), lengths (L), tip radius, and shape (Detail Z).

Material Tungsten Carbide ・ HSS ・ Palladium Allow
Diameter φ0.4 ・φ0.5 ・φ0.64 ・φ0.7 ・φ1.0
Angle 8°・ 10°・ 15°・ 20°・ 25°・ 30°

 

 

Tungsten Carbide (Minimum lot 20pcs)

Part Number Diameter (Ф) Tip Angle (°) Length (L) Tip Radius R(μR)
STD040A100L089R030CA098 0.4 10 8.9 30
STD070A100L250R025CA016 0.7 10 25 25
STD070A150L250R025CA017 0.7 15 25 25
STD070A150L250R050CA018 0.7 15 25 50
STD070A200L250R075CA019 0.7 20 25 75
STD070A200L250R100CA031 0.7 20 25 100

 

HSS(Minimum lot 20pcs)

Part Number Diameter (Ф) Tip Angle (°) Length (L) Tip Radius R(μR)
STD064A100L150R020HA002 0.64 10 15 20

 

Palladium Alloy (Minimum lot 20pcs)

Part Number Diameter (Ф) Tip Angle (°) Length (L) Tip Radius R(μR)
STD070A100L215R020TA090 0.7 10 21.5 20-25
STD070A100L250R020TA099 0.7 10 25 20

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+1-408-748-0100
Office Hours: 8:30am - 5:30pm PST

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