Probe Needle
Used as an accessory for probes in inspections and measurements of semiconductor and other applications. We offer customization to meet your specific needs and applications.
Probe needles are used throughout the semiconductor industry for inspection and measurement as a probe station accessory. These can be customized and manufactured to suit the exact application.
φ0.7 ・ θ15°・ 15μR |
φ0.7 ・ θ10°・ 150μR |
φ0.7 ・ θ15°・ 250μR |
We allow you to specify customized materials, diameters (φD), angles (θ), lengths (L), tip radius, and shape (Detail Z).
| Material | Tungsten Carbide ・ HSS ・ Palladium Allow |
| Diameter | φ0.4 ・φ0.5 ・φ0.64 ・φ0.7 ・φ1.0 |
| Angle | 8°・ 10°・ 15°・ 20°・ 25°・ 30° |
Tungsten Carbide (Minimum lot 20pcs)
| Part Number | Diameter (Ф) | Tip Angle (°) | Length (L) | Tip Radius R(μR) |
| STD040A100L089R030CA098 | 0.4 | 10 | 8.9 | 30 |
| STD070A100L250R025CA016 | 0.7 | 10 | 25 | 25 |
| STD070A150L250R025CA017 | 0.7 | 15 | 25 | 25 |
| STD070A150L250R050CA018 | 0.7 | 15 | 25 | 50 |
| STD070A200L250R075CA019 | 0.7 | 20 | 25 | 75 |
| STD070A200L250R100CA031 | 0.7 | 20 | 25 | 100 |
HSS(Minimum lot 20pcs)
| Part Number | Diameter (Ф) | Tip Angle (°) | Length (L) | Tip Radius R(μR) |
| STD064A100L150R020HA002 | 0.64 | 10 | 15 | 20 |
Palladium Alloy (Minimum lot 20pcs)
| Part Number | Diameter (Ф) | Tip Angle (°) | Length (L) | Tip Radius R(μR) |
| STD070A100L215R020TA090 | 0.7 | 10 | 21.5 | 20-25 |
| STD070A100L250R020TA099 | 0.7 | 10 | 25 | 20 |
+1-408-748-0100
Office Hours: 8:30am - 5:30pm PST
